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The QT-6000 test system is applied to test small and medium-sized power triode diode MOS-FET(IGBT) and wafer etc. The updated system covers built-in capacitance (DC+CAP) and Scanbox tests.
| Measurement Accuracy |
Current: < 0.5% Reading + 0.05% FullRange + 1.5nA Voltage: < 0.5% Reading + 0.05% FullRange + 1.5mV Capacitance: 0.5% Reading + 0.05% FullRange + 10fF |
| Technical Indicator |
Max Current/Voltage: 30A / 1200V Capacitance Measurement Range: 0.2-300pF (BIAS voltage range 0~80V, 1MHz) LCR Measurement Range: 0.1pF-0.1uF (DC Bias: 0-30V, 1MHZ) |
| DPI | 16 bit ADC/DAC |
| Waveform | Built-in oscilloscope |
Established in 2019, the operation focuses on international trade and integration of semiconductor industry equipment. Products are exported to over 30 countries with a customer base of over 200, aiming to provide high cost-effective solutions and risk avoidance for partners.
Main Product Range: Die Bonder, Wire Bonding, Laser Marking (ID IC Wafer), Laser Grooving, Laser Cutting, Si/SiC Laser Annealing Machine, Automatic Dicing Saw Machine, and Silicone Dispensing Equipment.